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33rd IEEE International Conference on Microelectronic Test Structures

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.

Due to the coronavirus (COVID-19) pandemic, the ICMTS Steering Committee and 2020 Organising Committee have decided to have hold a virtual conference hosted online with the assistance of the IEEE, the opening of the conference is the 4th of May and it will be open for two weeks. Registration for the virtual conference will be open very soon and we will announce the confirmed dates for the conference to go online as soon as this is confirmed with IEEE.

Find out more and to register