Section News

Watch Again | Extracting Vector Measurements at Millimetre and Sub-millimetre Wave Frequencies Without Using a Vector Network Analyser by Sillas Hadjiloucas

In this webinar, alternative methodologies for performing component characterisation without using vector network analysers will be discussed including how to perform amplitude and phase measurements using quasi-optical null-balance bridge techniques and how to measure propagation constants in waveguides.

This will be extended to how to perform antenna phase measurements when only video detectors are available and how broadband spectrometers can also be used to perform such measurements.

The webinar will show some interesting application examples.

Webinar Slides

Sillas Hadjiloucas (M’94-SM’13) received the B.Sc. (Hons.) M.Phil. degrees in pure and applied biology from the University of Leeds, UK, in 1989 and 1992, respectively and in 1996, a Ph.D. degree in cybernetics from the University of Reading UK.

After two appointments as an EC TMR Post-Doctoral Research Fellow working on THz Instrumentation as part of the INTERACT project in UK and the Deutsches Zentrum für Luft- und Raumfahrt (DLR Berlin), in January 2000 he was appointed Lecturer in Systems Engineering, at Reading university where he is now Associate Professor.

His expertise is in instrumentation and measurement across the Optical, IR, THz and microwave parts of the spectrum, the studying of ultrafast phenomena using femtosecond lasers and the application of control theory and system identification techniques to spectrometry and systems biology. He is a reviewer for more than 50 different journals (IEEE, OSA, AIP, IoP, IET etc) and served as AE for IEEE Sensors. He currently serves as Chair of IEEE Sensors UK & Ireland Chapter and was Chair of the IoP Instrument Science and Technology Group. He is a Fellow of the Institute of Measurement and Control and served as Committee member of the Dielectrics Group of the IoP. He has been involved in organising several conferences for the IoP and the IEEE.