EMC Chapter Technical Meeting | Novel EMC Measurement Test Techniques

Name: EMC Chapter Technical Meeting | Novel EMC Measurement Test Techniques
Start: 2023-09-27T17:45:00+00:00
End: 2023-09-27T20:00:00+00:00
Location: The Clayton Hotel Chiswick

IEEE UK and Ireland EMC Chapter presents a free meeting technical meeting open to IEEE, IET, CISPR A Members, and guests. Please register in advance no later than Monday, September 25, to ensure adequate seating and catering.

Agenda

5:45 pm Drink and Appetizer Service Opens
6:00 pm Welcome and Introductions – Alistair Duffy, De Montfort University, IEEE UK and Ireland EMC Chapter Chair
6:10 pm CISPR A and ANSC C63® Overview on Site Validation Measurements from 18 GHz to 40 GHz – Nicholas Abbondante, Intertek, Boxborough, MA, Secretariat CISPR A; C63.25.3 Working Group Chair
6:30 pm Recent Advances in EMC Test Site Evaluation Using Advanced Antenna Measurement Techniques – Zhong Chen, ETS-Lindgren, Cedar Park, TX, Vice-Chair ANSC C63, CISPR A Member
7:30 pm Live Demonstration of the New EMC Site Validation Technique proposed for ANSI C63.25.3 (18 GHz to 40 GHz)
8:00 pm End of formal program

Technical Program

Title: CISPR A and ANSC C63® Overview on Site Validation Measurements from 18 GHz to 40 GHz by Nicholas Abbondante, Global Chief Engineer, EMC, Intertek, Boxborough, MA

Abstract: Testing to FCC requirements at frequencies above 18 GHz has been occurring for many years, extending up to 231 GHz; however, there has never been a test site validation method developed for this frequency range. The assumption has been that sites qualified below 18 GHz were acceptable above that frequency, but this conclusion was not based on data. With the advent of transmitters operating at 25 and 38 GHz and above, site validation has become more critical, and testing in the far-field and within the beamwidth of the measurement antenna becomes more difficult. The goal of the C63.25.3 working group is to develop site validation methods from 18 GHz to 40 GHz to enhance the validity and repeatability of future measurements and to provide validations and correlations for alternative test sites such as compact antenna test ranges (CATRs) and reverberation chambers to help resolve the far-field testing issues.

Title: Recent Advances in EMC Test Site Evaluation Using Advanced Antenna Measurement Techniques By Zhong Chen, Chief Engineer, ETS-Lindgren, Cedar Park, TX

Abstract: Calibrating antennas and validating test sites are interdependent processes, as they both mandate accurate antenna measurements in their testing environment. Site VSWR, as specified in CISPR 16-1-4 or C63.25, is used as the figure of merit to qualify test site performance from 1 GHz to 18 GHz. In the CISPR method, the standing wave is measured by sampling scalar fields along several linear paths. However, in an effort to simplify the measurement, test data are severely under sampled.

Time Domain SVSWR, as specified in C63.25.1 (1-18 GHz), was developed to address the under sampling issues. For above 18 GHz tests, new challenges emerge, such as the need to test more locations in the Quiet Zone (QZ) and to measure the receive antenna beam coverage. Cylindrical Mode Filtered SVSWR developed as a result, which is now under active consideration in the C63.25.3 (18-40 GHz) and CISPR 16 standards.

Participants of the seminar will gain a deeper understanding on technical background (the whats and whys) of the evolution of the test methods, and how advanced antenna measurement techniques are used to help to solve the different technical challenges.

Title: Cylindrical Mode Filtered SVSWR Demonstration: Following the above presentation, Mr. Chen will conduct a LIVE demonstration.

Demonstration Abstract: The Cylindrical Mode Filtered SVSWR (CMF SVSWR) is measured by placing the transmit antenna (typically a low gain omni-directional antenna) at the edge of the turntable, and performing a single cut vector pattern measurement. The vector S21 as a function of turntable angle at each frequency is transformed to the spectrum domain, where a filter can be applied to mathematically remove the chamber effects.

The SVSWR is derived by comparing the original pattern in the chamber to the “clean” filtered pattern. This CMF SVSWR provides a more comprehensive evaluation of EMC chamber quiet zone, and can be readily measured without any special positioning fixtures. The demonstration will show an entire measurement process including the post processing which can be performed in real time. This new measurement technique is under consideration for the new draft standard ANSI C63.25.3 under development by the ANSC C63® committee for EMC test sites from 18 GHz to 40 GHz.

About the Speakers

Alistair Duffy is Professor of Electromagnetics and Head of Research and Innovation in the Faculty of Technology at De Montfort University, Leicester, UK. He received the Bachelor’s degree in electrical and electronic engineering and the M.Eng. degree from University College, Cardiff, UK, in 1988 and 1989, respectively. After receiving the Master’s degree, he joined the research group of professors Christopoulos and Benson at Nottingham University. There he worked on experimental validation of numerical modelling and received his Ph.D. in 1993.

Professor Duffy completed his professional education in 2004 with an MBA from Open University, UK. He is widely published, with over 200 technical papers and articles, mostly on his research interests of validation of computational electromagnetics; physical layer components, particularly communications cabling, and electromagnetic compatibility testing. He is a past Associate Editor for the IEEE Transactions on EMC and Associate Editor of the ACES Journal. Other professional activities include standards body work in the UK (British Standards Institute) and in the IEEE, where he is a past Chair of the EMC Society’s Standards Development and Education Committee (SDECom).

He has served the IEEE EMC Society in various roles since 2008, including as a Distinguished Lecturer, Vice President Conference Services, and as President (2020-2021). Currently he is the IEEE Division IV Director and Chair of the IEEE UK and Republic of Ireland EMC Chapter. In 2015, Dr. Duffy was elected to the grade of IEEE Fellow for the development of validation methods in computational electromagnetics. He has supervised more than 30 Ph.D. students during his career.

Nicholas Abbondante has served as Intertek’s Chief EMC Engineer since 2013, responsible for technical support of Intertek’s global network of 24 EMC labs. In his 22+ years with the company, he has been involved in testing a wide range of radio and electronic equipment to EMC requirements for regulatory domains around the world, specializing in transmitters and medical devices. He is the Technical Manager of Intertek’s TCB program and is TCB Council Board Vice Chair, and serves as the CISPR/A Secretariat.

An active participant in many ANSC C63 standards projects, he is chair of both C63.31 for ISM device measurement and C63.25.3 for 18-40 GHz test site validation, and was recently elected as the incoming chair of Subcommittee 4 for wireless and ISM equipment measurements. He is also a working group member of C63.10 and C63.26 for radio testing, C63.4 Emissions, C63.16 ESD, C63.33 EAS immunity and the recently completed C63.2 Receiver, C63.29 Lighting and C63.30 Wireless Power Transfer standards. Nick has a Bachelor’s degree in physics from the Worcester Polytechnic Institute (WPI) in Massachusetts, USA.

Zhong Chen is Chief Engineer at ETS-Lindgren, located in Cedar Park, Texas. He has over 25 years of experience in RF testing, anechoic chamber design, as well as EMC antenna and field probe design and measurements. He is an active member of the ANSC C63® committee currently serving as Vice-Chair and is the immediate past Chair of Subcommittee 1 which is responsible for the antenna calibration (ANSI C63.5) and chamber/test site validation standards (ANSI C63.4 and the ANSI C63.25 series).

Mr. Chen is chair of the IEEE Standard 1309 committee responsible for developing calibration standards for field probes, and IEEE Standard 1128 for absorber evaluation. Currently he is a member of the IEEE EMC Society Board of Directors and a former member of the Antenna Measurement Techniques Association (AMTA) Board of Directors.

He is a past Distinguished Lecturer for the EMC Society and is recognized as an AMTA Fellow. His research interests include measurement uncertainty, time domain measurements for site validation and antenna calibration, and development of novel RF absorber materials. Several papers authored and co-authored by Mr. Chen have received best paper recognition at global conferences. Zhong Chen received his M.S.E.E. degree in Electromagnetics from the Ohio State University at Columbus. He may be reached at zhong.chen@ets-lindgren.com.